00976nam0-22003251i-450-99000048967040332120090330141246.00-471-28028-3000048967FED01000048967(Aleph)000048967FED0100004896720020821d1981----km-y0itay50------baenga-------001yyReliability and degradationsemiconductor devices and circuitsM. J. Howes , D. V. MorganNew YorkWiley & sons©1981444 p.ill.23 cm<<The >>Wiley series in solid state devices and circuitsSemiconduttori621.381'52Howes,Michael John26554Morgan,D. V.27185ITUNINARICAUNIMARCBK99000048967040332110 E I 30911315DINELDINELReliability and degradation332694UNINA