01000nam0-22002891i-450-99001009475040332120160801181932.0001009475FED01001009475(Aleph)001009475FED0100100947520160801d1994----km-y0itay50------baengITLarge scale applications and radiation hardness of semiconductor detectors3. International Conference, Firenze, October 1-3, 1997edited by E. Focardi and G. ParriniBolognaSocietà italiana di fisica1999IV, 181 p.ill.25 cmSemiconduttoriFocardi,EttoreParrini,GiulianoInternational Conference on Large scale applications and radiation hardness of semiconductor detectors3.<1997 ;Firenze>ITUNINARICAUNIMARCBK99001009475040332130-100.00124415FI1FI1UNINA